Atomic Resolution Electron Energy Loss Spectroscopy of Interfaces
نویسندگان
چکیده
منابع مشابه
Data processing for atomic resolution electron energy loss spectroscopy.
The high beam current and subangstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopy (EELS) mapping with atomic resolution. These spectral maps are often dose limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage o...
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by electron energy loss spectroscopy Julia A. Mundy, Qingyun Mao, Charles M. Brooks, Darrell G. Schlom, and David A. Muller School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA Department of Materials Science and Engineering, Pennsylvania State University, Unive...
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An all-magnetic monochromator/spectrometer system for sub-30 meV energy-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope is described. It will link the energy being selected by the monochromator to the energy being analysed by the spectrometer, without resorting to decelerating the electron beam. This will allow it to attain spectral energy stability...
متن کاملFundamentals of electron energy-loss spectroscopy
Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scan...
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We discuss various factors that determine the performance of electron energy-loss spectroscopy (EELS) and energy-filtered (EFTEM) imaging in a transmission electron microscope. Some of these factors are instrumental and have undergone substantial improvement in recent years, including the development of electron monochromators and aberration correctors. Others, such as radiation damage, delocal...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 1997
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927600011624